SNI News

Nanonews August 2010

EVENTS

550-Jahrfeier



For the celebrations of the 550 years anniversary of the University of Basel, the SNI presented the fascination of Nanoscience to the broad public. Embedded in the enourmously rich Science exhibition "Campus Naturwissenschaften", our Nanorama invited the public to perform their own experiments and to   more...

NanoTechDay 2010



Together with the innovation network "i-net nano", the SNI organised a Nanotechday in the facilitites of Hotel Hilton on the 11th May 2010. The Nanotechday 2010 followed the success of the same event, held in Aarau in 2009. With more than a hundred guests, the large auditorium was crowded and during   more...

Nano in the Snow

The next “Nanoscience In the Snow” meeting organized in the framework of the Swiss NCCR “Nanoscale Science” from Wednesday Jan. 19th to Friday Jan. 21st 2011. Details about registration, location and program will be announced during Fall on our website.


READY FOR THE FUTURE

SNI Beiratssitzung



The intensive collaboration between the Swiss Nanoscience Institute and the SNF in terms of the NCCR Nanoscale Science is gowing to be reduced in the next years. In order to define future strategies and goals of the SNI, director Christian Schönenberger and founding director Hans-Joachim Güntherodt discussed   more...

NEW IN THE SNI

We are happy to welcome our new SNI members:

Since 01.01.2010:
Treutlein Philipp
Möller Christel
Perinkulam Ramanathan Subramanian
Müller Daniel
Stahlberg Henning
Banafsheh Abasahl
Harzmann Gero
Rössler Clemens
Aldana Samuel
Strübi Grégory
Jöckel Andreas
Xue Fei
Doyon Alain







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Agenda

30.09.2010
Argovia Call 2010
The Argovia Call 2010 is now open. For further information:
more information and application form

Newsticker

Recent publications

Force-detected nuclear magnetic resonance: recent advances and future challenges
M. Poggio and C. L. Degen
Nanotechnology
We review recent efforts to detect small numbers of nuclear spins using magnetic resonance force microscopy. Magnetic resonance force microscopy (MRFM) is a scanning probe technique that relies on the
Link to journal

Role of negatively charged defects in the lattice contraction of Al-Si-N
C. A. Pignedoli, D. Passerone, H. J. Hug, A. Pélisson-Schecker, and J. Patscheider
APPLIED PHYSICS LETTERS 96, 071908 (2010)
Experiments reveal that incorporation of substitutional Si in wurtzite AlN up to 6 at. % results in a lattice contraction in the [0001] direction. The contraction is linear and, for higher silicon con
Link to journal

Full list of publications